首页> 外国专利> Self-aligning sampling system and logic analyser comprising a number of such sampling systems

Self-aligning sampling system and logic analyser comprising a number of such sampling systems

机译:自对准采样系统和逻辑分析仪,包括多个此类采样系统

摘要

A self-aligning sampling system is proposed for sampling digital signals, for example in a logic analyser. The sampling system comprises an adjustable delay line with tapping points for clock signals. In conjunction with the system clock, the further clock signals are used to take several samples of the digital signal in a time slot of the system clock. In order to achieve equidistant sampling even in the case of a large process spread in elementary delay units of the delay line, the delay line is calibrated. The system clock is then connected to the data input and expressed in elementary delay units on the basis of measurement. Subsequently, the delay line between clock signal tapping points is adjusted on the basis thereof.
机译:提出了一种自对准采样系统,用于例如在逻辑分析仪中对数字信号进行采样。采样系统包括带有时钟信号分接点的可调延迟线。结合系统时钟,其他时钟信号用于在系统时钟的时隙中对数字信号进行几个采样。为了即使在以延迟线的基本延迟单元进行大的处理扩展的情况下也能实现等距采样,所以对延迟线进行校准。然后,系统时钟连接到数据输入,并根据测量以基本延迟单位表示。随后,基于其调整时钟信号分接点之间的延迟线。

著录项

  • 公开/公告号EP0455294A3

    专利类型

  • 公开/公告日1991-11-13

    原文格式PDF

  • 申请/专利权人 FLUKE CORPORATION;

    申请/专利号EP19910200990

  • 发明设计人 LANKREIJERWILLEM;

    申请日1991-04-25

  • 分类号G06F11/22;H03K5/135;

  • 国家 EP

  • 入库时间 2022-08-22 05:30:42

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号