METHOD OF MEASURING THE DEPTH OF SLOTS SIMULATING CRACKS ON A STANDARD SPECIMEN

摘要

The invention relates to measuring equipment, namely to the non-destructive quality control items, and can be applied to measurements of narrow slits in the process of manufacturing a standard sample. The purpose of the invention - an increase of measurement accuracy and extension of use by providing the slit depth measurement on the sample with any of its surface profile. When electrodischarge method of manufacturing an electrode placed in the gap, it is fed to voltage and determined information parameter which is used to determine the depth of the slit. As information parameters using the vertical movement of the electrode 2s and 2.2 to the sample surface at two points to the beginning of the slit and producing the vertical movement of Z and 2n electrodes at the same points after manufacture slit and the slit depth h opredelg- according to the formula h ( Zi - Za) - (22 - 2p, where Zs -. peremeschen- values ​​vertical "electrode in place of forming slits in a first point 2.2 and Z4 - the vertical movement of the electrode on the second surface 1 yl point (a..