首页> 外国专利> System for ensuring reproducible thermal test conditions in loading tests - carried out on power semiconductors using cooling body with closed cooling system also fixings and contacts between semiconductors and cooling body

System for ensuring reproducible thermal test conditions in loading tests - carried out on power semiconductors using cooling body with closed cooling system also fixings and contacts between semiconductors and cooling body

机译:用于确保负载测试中可重现的热测试条件的系统-使用带有封闭式冷却系统的冷却体在功率半导体上进行的系统,该系统还固定和接触半导体与冷却体

摘要

A contact surface (KF) of the cooling body (KK) designed as a tank (W), contains distilled water as the contact, with reducing surface tension. A capillary active material is added to the distilled water for lowering the surface tension. The contact surface (KF) of the tank (W) of the cooling body (KK) is constructed with slots (N). ADVANTAGE - Maintains transition resistance between semiconductor being tested and cooling body. Provides constant equal conditions so that only small uncritical pressure force of unit under test at cooling body is required. Reduces cost and wear at contact surface, with series load testing.
机译:被设计为水箱(W)的冷却体(KK)的接触面(KF)包含蒸馏水作为接触面,从而减小了表面张力。将毛细管活性材料添加到蒸馏水中以降低表面张力。冷却体(KK)的容器(W)的接触表面(KF)构造有狭槽(N)。优点-保持被测半导体与冷却体之间的过渡电阻。提供恒定的相等条件,因此仅需要很小的待测单元在冷却体处的非临界压力。通过串联负载测试,降低了成本并降低了接触表面的磨损。

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