首页> 外国专利> Infrared radiation intensity measuring appts. - has infrared detector on Peltier cooling element connected to constant current source and amplifier controlled by Peltier element voltage drop

Infrared radiation intensity measuring appts. - has infrared detector on Peltier cooling element connected to constant current source and amplifier controlled by Peltier element voltage drop

机译:红外辐射强度测量装置。 -在珀尔帖冷却元件上具有红外探测器,该红外探测器连接到恒定电流源,并由珀尔帖元件压降控制放大器

摘要

The appts. includes an infrared detector (14) with two outputs (16, 18). Each output is associated with a signal voltage connection (20, 22). The detector is mounted on a Peltier cooling element (24). The Peltier element is connected to a constant current source (26). The control parameter of an amplifier circuit (28) connected between one of the outputs and the corresp. signal voltage connection is the voltage drop across the Peltier element. USE/ADVANTAGE - For measuring e.g. laser intensity. Very simple design; compensates temp. dependency of detector mounted on Peltier element without need for special temp. sensor.
机译:苹果。包括具有两个输出(16、18)的红外检测器(14)。每个输出都与信号电压连接(20、22)相关联。检测器安装在珀耳帖冷却元件(24)上。珀耳帖元件连接到恒定电流源(26)。连接在输出之一和对应之间的放大器电路(28)的控制参数。信号电压连接是Peltier元件两端的电压降。使用/优势-用于测量激光强度。非常简单的设计;补偿温度无需特殊温度,安装在Peltier元件上的探测器的依赖性。传感器。

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