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Possess the gate capacity which it makes decrease the MOSFET configuration body and its production manner

机译:具备使栅极容量减小MOSFET的构造体及其生产方式

摘要

In one embodiment, a vertical MOSFET is formed having a lower gate portion (124) overlying the channel region of the MOSFET and separated from the channel region by a thin gate oxide layer (90). An upper gate portion (120) is formed overlying the drain of the MOSFET and separated from the drain by a relatively thick oxide layer (86). In this particular embodiment, since the dielectric thickness between the upper gate portion (120) and the drain (82) is relatively large, the MOSFET exhibits a lower gate-drain capacitance (CGD) value, while the threshold voltage of the MOSFET remains relatively unchanged. The upper gate portion (120) may be electrically connected to the lower gate portion (124) or may be electrically isolated from the lower gate portion (124). A preferred method of forming the resulting MOSFET having this lowered CGD allows the source (92) and body regions (88) to be precisely aligned with the drain edge of the lower gate portion (124).
机译:在一个实施例中,形成垂直MOSFET,其具有覆盖MOSFET的沟道区并由薄的栅极氧化物层(90)与沟道区分开的下栅极部分(124)。上栅极部分(120)形成为覆盖MOSFET的漏极,并通过相对较厚的氧化物层(86)与漏极分开。在该特定实施例中,由于上栅极部分(120)和漏极(82)之间的电介质厚度相对较大,因此MOSFET展现出较低的栅极-漏极电容(CGD)值,而MOSFET的阈值电压保持相对不变。上栅极部分(120)可以电连接到下栅极部分(124),或者可以与下栅极部分(124)电隔离。形成具有降低的CGD的所得MOSFET的优选方法允许源极(92)和体区(88)与下栅极部分(124)的漏极边缘精确对准。

著录项

  • 公开/公告号JPH05507385A

    专利类型

  • 公开/公告日1993-10-21

    原文格式PDF

  • 申请/专利权人

    申请/专利号JP19910504415

  • 发明设计人

    申请日1991-01-22

  • 分类号H01L29/784;H01L21/336;H01L29/784;

  • 国家 JP

  • 入库时间 2022-08-22 05:22:01

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