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FLAW SIGNAL EXTRACTION CIRCUIT IN ULTRASONIC FLAW DETECTION APPARATUS

机译:超声波缺陷检测仪中的缺陷信号提取电路

摘要

PURPOSE:To extract only a flaw signal, by removing a noise component from the output signal of an ultrasonic flaw detection apparatus. CONSTITUTION:Only the signal of set voltage or more in the output signal Bout from an ultrasonic flaw detection apparatus main body 6 passes an analogue switch 14 to be supplied to an A/D converter 5 to be converted to a digital signal which is, in turn, taken in a memory 16 but, when the number of times of the signal Bout continuously passing through th switch 14 is n-times short of a set value, (n) digital data taken in the memory are not regarded as the flaw data corresponding to a flaw and are erased. Therefore, a noise component can be effectively removed as compared with a case removing the noise component only by the magnitude of the signal Bout.
机译:目的:通过从超声探伤仪的输出信号中去除噪声分量,仅提取探伤仪信号。组成:只有在超声波探伤设备主体6的输出信号Bout中设置电压以上的信号才通过模拟开关14,以提供给A / D转换器5,并转换为数字信号,即转入到存储器16中,但是当连续通过开关14的信号Bout的次数比设定值短n倍时,(n)存储器中获得的数字数据不被视为缺陷数据。对应于缺陷并被删除。因此,与仅通过信号Bout的大小去除噪声分量的情况相比,可以有效地去除噪声分量。

著录项

  • 公开/公告号JPH0558503B2

    专利类型

  • 公开/公告日1993-08-26

    原文格式PDF

  • 申请/专利权人 MITSUBISHI GENSHI NENRYO KK;

    申请/专利号JP19860296272

  • 发明设计人 YAGINUMA YOSHITAKA;

    申请日1986-12-12

  • 分类号G01N29/22;G01N29/10;

  • 国家 JP

  • 入库时间 2022-08-22 05:21:31

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