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METHOD OF GROWTH OF GAAS SINGLE CRYSTAL HAVING SEMIINSULATING PROPERTY

机译:具有半绝缘特性的GaAs单晶的生长方法

摘要

PURPOSE:To make a compensation ratio of a doped donor impurity constant in the direction of crystal growth, by removing a part rich in impurity from a GaAs polycrystalline ingot having a specific composition containing oxygen, regrowing single crystal from the melt of polycrystal. CONSTITUTION:Horizontal Bridgeman method is used. (i) The boat 3 having the seed crystal 2 of GaAs and the Ga-As mixture 4 containing the oxygen 5 is arranged in one side of the reaction tube 1, and As powder is placed on the other side of the diffusion barrier 6. Then, the tube 1 is heated, the melt of the mixture 4 and the As vapor 8 are formed, and cooled successively from part that is brought into contact with the seed crystal 2, to grow a polycrystalline ingot having a ratio of Ga/As of 1.0000001-1.1276598 and an oxygen concentration of 6X1015-1X1018cm-3. (ii) Then, ends including a tail side are removed from the ingot, and (iii) the prepared polycrystalline ingot 41 is melted by the same procedure as that of the process i to regrow the single crystal of GaAs.
机译:目的:通过从具有特定成分的含氧的GaAs多晶锭中去除富含杂质的部分,使多晶熔体中的单晶生长,从而使掺杂的施主杂质的补偿比在晶体生长方向上恒定。构成:采用水平布里奇曼法。 (i)将具有GaAs的籽晶2和包含氧5的Ga-As混合物4的舟皿3布置在反应管1的一侧,并且将As粉末置于扩散阻挡层6的另一侧。然后,加热管1,形成混合物4和As蒸气8的熔体,并从与籽晶2接触的部分开始连续冷却,以生长具有Ga / As比的多晶锭。氧浓度为1.0000001-1.1276598,氧浓度为6X10 15 -1X10 18 cm -3。 (ii)然后,从锭上去除包括尾侧的端部,并且(iii)通过与方法i相同的步骤熔化所制备的多晶锭41,以再生GaAs单晶。

著录项

  • 公开/公告号JPH0569798B2

    专利类型

  • 公开/公告日1993-10-01

    原文格式PDF

  • 申请/专利权人 NIPPON ELECTRIC CO;

    申请/专利号JP19840089676

  • 发明设计人 TSUJI TSUTOMU;

    申请日1984-05-04

  • 分类号C30B11/00;C30B29/42;H01L21/208;

  • 国家 JP

  • 入库时间 2022-08-22 05:21:04

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