首页> 外国专利> MRASURING METHOD FOR IMPURITY DIFFUSION COEFFICIENT IN SOLID

MRASURING METHOD FOR IMPURITY DIFFUSION COEFFICIENT IN SOLID

机译:固体中杂质扩散系数的测量方法

摘要

PURPOSE:To enable easily measuring the diffusion coefficient in an actual material such as steel and use the obtained diffusion coefficient for predicting precipitation and phase separation by applying the method for obtaining easily and simply the diffusion coefficient of impurity in solid. CONSTITUTION:The density distribution in the direction of diffusion of solute atoms transmitting by diffusion inside from solid surface is obtained using the density of diffusion atoms quantified from the rate of spattering of each atom obtained from the emission intensity of solid structure atoms in each spattering stage in glow discharge emission spectrometry method, and the spattering depth calculated with the spattering rate and the density of each component solid and the obtained density distribution is matched with the solution of a diffusion equation to obtain the diffusion coefficient of the solute atoms. By this, the diffusion coefficient of impurity is measured more easily than the method analyzing a radioactive atom in depth direction or analyzing diffusion cross section microscopically.
机译:目的:为了能够容易地测量在诸如钢之类的实际材料中的扩散系数,并通过应用简单而简单地获得固体中杂质扩散系数的方法,将获得的扩散系数用于预测沉淀和相分离。组成:在固相原子内部通过扩散从内部传播而传播的溶质原子的扩散方向上的密度分布,是根据每个原子的散射速率(从每个溅射阶段的固体结构原子的发射强度获得的)量化的扩散原子密度获得的在辉光放电发射光谱法中,将由溅射速率和各组分固体的密度以及所获得的密度分布计算出的溅射深度与扩散方程的解相匹配,以获得溶质原子的扩散系数。这样,与在深度方向上分析放射性原子或在微观上分析扩散截面的方法相比,更容易测量杂质的扩散系数。

著录项

  • 公开/公告号JPH05149879A

    专利类型

  • 公开/公告日1993-06-15

    原文格式PDF

  • 申请/专利权人 NIPPON STEEL CORP;

    申请/专利号JP19910316190

  • 发明设计人 SUZUKI SHIGERU;

    申请日1991-11-29

  • 分类号G01N21/67;

  • 国家 JP

  • 入库时间 2022-08-22 05:17:47

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