首页> 外国专利> MODULATION INDEX MEASUREMENT SYSTEM IN LIGHT DIRECT MODULATION PSK SYSTEM AND METHOD FOR CONTROLLING SEMICONDUCTOR LASER USING IT

MODULATION INDEX MEASUREMENT SYSTEM IN LIGHT DIRECT MODULATION PSK SYSTEM AND METHOD FOR CONTROLLING SEMICONDUCTOR LASER USING IT

机译:直接调制PSK系统中的调制指数测量系统及使用它的半导体激光控制方法

摘要

PURPOSE: To enable a modulation index to be measured easily. ;CONSTITUTION: An intermediate frequency signal obtained by detecting what is obtained by superposing a signal light modulated by the PSK system with a local oscillation light is doubled by a frequency doubler 5 and is fed to a frequency analyzer 6, thus obtaining a modulation index based on a frequency difference of large two frequency components which appear at the frequency analyzer 6.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:使调制指数易于测量。 ;组成:通过检测由PSK系统调制的信号光与本地振荡光叠加而获得的中频信号,由倍频器5加倍,并馈送到频率分析仪6,从而获得基于出现在频率分析仪6上的两个大频率分量的频差上。版权所有:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH0526736A

    专利类型

  • 公开/公告日1993-02-02

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19910177916

  • 申请日1991-07-18

  • 分类号G01J9/00;G02F2/00;H01L21/66;H01S3/103;H04B10/08;H04L27/18;

  • 国家 JP

  • 入库时间 2022-08-22 05:14:18

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