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MODULATION INDEX MEASUREMENT SYSTEM IN LIGHT DIRECT MODULATION PSK SYSTEM AND METHOD FOR CONTROLLING SEMICONDUCTOR LASER USING IT
MODULATION INDEX MEASUREMENT SYSTEM IN LIGHT DIRECT MODULATION PSK SYSTEM AND METHOD FOR CONTROLLING SEMICONDUCTOR LASER USING IT
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机译:直接调制PSK系统中的调制指数测量系统及使用它的半导体激光控制方法
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摘要
PURPOSE: To enable a modulation index to be measured easily. ;CONSTITUTION: An intermediate frequency signal obtained by detecting what is obtained by superposing a signal light modulated by the PSK system with a local oscillation light is doubled by a frequency doubler 5 and is fed to a frequency analyzer 6, thus obtaining a modulation index based on a frequency difference of large two frequency components which appear at the frequency analyzer 6.;COPYRIGHT: (C)1993,JPO&Japio
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