首页> 外国专利> CIRCUIT AND METHOD FOR MEASURING MICROVOLTAGE, AUTOMATIC APPARATUS AND METHOD FOR MEASUREMENT

CIRCUIT AND METHOD FOR MEASURING MICROVOLTAGE, AUTOMATIC APPARATUS AND METHOD FOR MEASUREMENT

机译:测量微压的电路和方法,自动装置和测量方法

摘要

PURPOSE: To obtain an automatic apparatus and method for measurement to be used for an insulation test and the like of a semiconductor device, in particular, and a circuit and method for measuring a microvoltage which enable attainment of the above apparatus and method, regarding an apparatus and method for testing a reed switch. ;CONSTITUTION: A pulse voltage generating means 1A for supplying a current to an object 3A to be measured which has a capacity component CS, a contactor 4A coming into contact with the object 3A, a minute voltage detecting means 1C which detects a microvoltage ΔV outputted from the object 3A, and a control means 1B which controls input/output of the pulse voltage generating means 1A and the microvoltage detecting means 1C, are provided. A construction is so made as to include comparison of the microvoltage ΔV with a reference voltage VS by the microvoltage detecting means 1C.;COPYRIGHT: (C)1993,JPO&Japio
机译:用途:特别是,获得一种用于半导体装置的绝缘测试等的自动测量装置和方法,以及一种能够实现上述装置和方法的,用于测量微电压的电路和方法,涉及一种用于测试舌簧开关的装置和方法。 ;组成:脉冲电压产生装置1A,用于向具有电容成分CS的被测物体3A供电,接触器4A与物体3A接触,微小电压检测装置1C,用于检测输出的微电压ΔV在被检体3A上设有控制装置1B,该控制装置1B控制脉冲电压产生装置1A和微电压检测装置1C的输入/输出。这样构成,包括通过微电压检测装置1C将微电压ΔV与参考电压VS进行比较。;版权:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH0580082A

    专利类型

  • 公开/公告日1993-03-30

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19910238321

  • 发明设计人 HIRATA KANEMI;

    申请日1991-09-18

  • 分类号G01R19/00;G01R27/02;

  • 国家 JP

  • 入库时间 2022-08-22 05:14:00

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