METHOD FOR INSPECTING MAGNETIC DOMAIN AND MAGNETIC CONSTRUCTION BY USING SCANNING TUNNELING MICROSCOPE

摘要

PURPOSE: To obtain an inspection technology for magnetic domain in nano order. ;CONSTITUTION: While a tunnel current detection chip 1 of STM is applied with bias magnetic field by using a coil 3, the conductance difference is detected to judge whether the magnetic domain direction of substance 2 and the magnetizing direction of the chip 1 are parallel or unparallel to each other, so the magnetic domain of the substance 2 can be recognized. Therefore it becomes possible to inspect the magnetic domain with a resolution of nano meter order.;COPYRIGHT: (C)1993,JPO&Japio