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PROCESS FOR THERMALLY DEPOSITING SILICON NITRIDE AND SILICON DIOXIDE FILMS ONTO A SUBSTRATE

机译:将氮化硅和二氧化硅薄膜热沉积到基质上的过程

摘要

a thermal deposition process in the gas phase by chemical method to form films of silicon nitride and silicon dioxide on a substrate, and is characterized by the following steps: (a) the introduction of di tert butylsilane and at least a second reactive gas, capabl (e) to react with di tert butylsilane to form silicon nitride or silicon dioxide.in a reaction zone of a chemical vapour deposition with the substrate on which is formed on the silicon nitride film and a silicon dioxide film; (b) maintaining the temperature of the area of substrate between about 900 c c c ) maintaining the pressure in the area between 0.1 torr and 10 torr to about approximately; and (d) of the gas passage to be put in contact with the substrate for a long enough period to form a film of silicon nitride or silicon dioxide on a substrate.
机译:一种通过化学方法在气相中进行热沉积的方法,以在基板上形成氮化硅和二氧化硅的膜,其特征在于以下步骤:(a)引入二叔丁基硅烷和至少第二种反应性气体, (e)在化学汽相淀积的反应区中与二叔丁基硅烷反应形成氮化硅或二氧化硅,在氮化硅膜和二氧化硅膜上形成衬底。 (b)将衬底区域的温度保持在大约900℃至大约cc)将区域中的压力保持在0.1托至10托之间至大约; (d)使气体通道与衬底接触足够长的时间以在衬底上形成氮化硅或二氧化硅膜。

著录项

  • 公开/公告号EP0417202B1

    专利类型

  • 公开/公告日1993-02-03

    原文格式PDF

  • 申请/专利权人 OLIN CORPORATION;

    申请/专利号EP19890907443

  • 发明设计人 DORY THOMAS S.;

    申请日1989-05-22

  • 分类号B05D5/12;C23C16/34;C23C16/40;

  • 国家 EP

  • 入库时间 2022-08-22 05:06:18

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