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Clamp-on current measuring probe and method of calibration of this probe

机译:钳式电流测量探头及其校准方法

摘要

The clamp-on current measuring probe (2) is associated with a device (30) for calibration. This preferably comprises a calibration cable (14) arranged in the clamp closing gap (10), which is connected in series with a constant current source (38) via a current measuring device (32) and a calibration key (34). If the calibration key (34) is operated, a predetermined calibration current (IK) flows through the calibration cable (14). The measured current (I'M) indicated by the measuring device (24) is compared with the calibration current (IK) and if the two values differ, the clamp-on current measuring probe (2) is checked for the existence of an air gap (16) or other causes of the fault and the measured indication is corrected. IMAGE
机译:钳式电流测量探头(2)与用于校准的设备(30)关联。优选地,其包括布置在夹具闭合间隙(10)中的校准电缆(14),该校准电缆通过电流测量装置(32)和校准键(34)与恒流源(38)串联连接。如果操作了校准键(34),则预定的校准电流(IK)流经校准电缆(14)。将测量设备(24)指示的测量电流(I'M)与校准电流(IK)进行比较,如果两个值不同,则检查钳位电流测量探头(2)是否存在空气间隙(16)或其他故障原因,并纠正了测得的指示。 <图像>

著录项

  • 公开/公告号EP0560148A1

    专利类型

  • 公开/公告日1993-09-15

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号EP19930103111

  • 发明设计人 BRUNSWICK JOACHIM DIPL.-ING.;

    申请日1993-02-26

  • 分类号G01R1/22;G01R15/02;G01R35/00;

  • 国家 EP

  • 入库时间 2022-08-22 05:05:14

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