DEVICE FOR TESTING ELECTRONIC INSTRUMENTS IN EQUIVALENT GENERATOR MODE

摘要

uses: in the electronic technology, in particular to a device u0434u043bu00a0 u0438u0441u043fu044bu0442u0430u043du0438u00a0 u044du043bu0435u043au0442u0440u043eu0432u0430u043au0443u0443u043cu043du044bu0445 and semi-conductor devices in the mode, the equivalent u0433u0435u043du0435u0440u0430u0442u043eu0440u043du043e mu. the essence of the u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0: device contains the test device 1, the sources 2, 3, 4 u043fu043eu0441u0442u043eu00a0u043du043du043eu0433u043e u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0 sources 5, 6 u043fu0443u043bu044cu0441u0438u0440u0443u044eu0449u0435u0433u043e u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0 in the form of a two stroke single-phase u0432u044bu043fu0440u00a0u043cu0438u0442u0435u043bu0435u0439.reduction of dimensions, mass and materials u0440u0438u0430u043bu043eu0435u043cu043au043eu0441u0442u0438 device u0434u043bu00a0 tests by u0438u0437u043cu0435u043du0435u043du0438u00a0 principle u0444u043eu0440u043cu0438u0440u043eu0432u0430u043du0438u00a0 u043du0430u043fu0440u00a0u0436u0435u043du0438u0439 on electrodes u0434u043eu0441u0442u0438u0433u0430u0435u0442u0441u00a0 those wh about between the anode and the matter source of u043fu043eu0441u0442u043eu00a0u043du043du043eu0433u043e u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0, as well as between the mesh and the u0441u0435u0442u043eu0447u043du044bu043c source of u043fu043eu0441u0442u043eu00a0u043du043du043eu0433u043e u043du0430u043fu0440u00a0u0436u0435u043du0438u00a0 include u0434u0432u0443u0445u0442u0430u043au0442u043du044bu0435 u043eu0434u043du043eu0444u0430u0437u043du044bu0435 u0432u044bu043fu0440u00a0u043cu0438u0442u0435u043bu0438. 3).