Testing circuit components of processor-controlled modules of communication system - applying single sufficient test program from memory zones of SRAM and DRAM arrangement including start information

摘要

Several individual components are tested, and test procedures (TP1...TPn) are integrated, controlled by a drive system, with which at a test type terminal of the of the assembly (UCB), can be connected to a voltage source depending on a specified level range. The components are tested in a test system separate from the communication system, either by a formed module test task, or by a formed system test task, a system assembly test, with which the assemblies (UCB...) in the communication system are tested. After the introduction of a system test depending on the existence of at least one item of test data (ti) stored in specific sections of a storage unit (DRAM) arrange in the assembly and/or a test data item (tf) indicating the assembly type of test, which is stored in a specified storage section of the storage unit, either a restart test formed by a restart test task is introduced or a new start test formed by a new start test task. Following a successful system test, the drive system of the communication system is started and during the determined operation of the assemblies at specified intervals, routine tests monitor the circuit components. After the identification of a circuit fault by a routine test, fault producing diagnostic tests are introduced. The test procedures (TP1...TPn) for each type of test are listed in a test procedure table, which, with the help of test cycle controls (ETAS, RTAS, DAS), are controlled successfully in the sense of carrying out specified circuit structural tests. USE/ADVANTAGE - Communication system, e.g. ring mains connection unit or ring mains transition unit. All types of test are standardized as far as possible.