首页> 外国专利> Indicating and measuring very small deformations in components - illuminating surface with monochromic light, with flat piece of glass applied and evaluating interference lines

Indicating and measuring very small deformations in components - illuminating surface with monochromic light, with flat piece of glass applied and evaluating interference lines

机译:指示和测量组件中很小的变形-用单色光照射表面,并应用平坦的玻璃片并评估干涉线

摘要

The method of measuring and/or making visible small component deformations involves using interference. A flat piece of glass (28) is placed onto a flat surface of the component (18) which is then illuminated with monochromatic light. The component is then subjected to a force or to forces and the resulting interference lines are evaluated. The flat surface can be made on the component or a body with a flat surface can be stuck onto it. USE/ADVANTAGE - Enables very small (e.g. in micron range and below) deformations to be measured, e.g. on polished surfaces for axial face seals of pressure chambers.
机译:测量和/或使可见的小部件变形的方法涉及使用干涉。将一块平板玻璃(28)放在部件(18)的平坦表面上,然后用单色光照射。然后使部件受到一个或多个力,并评估产生的干涉线。可以在组件上制作平坦表面,也可以将带有平坦表面的主体粘贴到组件上。使用/优势-能够测量很小的变形(例如在微米范围内和以下),例如在抛光表面上用于压力腔的轴向端面密封。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号