Optical measurement device for measuring material mechanical properties - processes successive images of contour of beam deflected under measured loads for computation of deformation characteristics

摘要

An elongated component (pref. a beam) (1) extending in the x direction undergoes stress applied in the y direction by a loading device (3). A pref. diffuse light source (4) shines on to a CCD matrix imager (5) wired to a processor (6), which also receives signals from a transducer (7) measuring the applied force. Between successive loadings, images are recorded and resoln. is improved by grey-level processing. USE/ADVANTAGE - Also for observation and evaluation of cracking in component, contactless measurement can combine determn. of macroscopic characteristics with microscopic observation in micron range.