Circuit for measuring small currents in semiconductors with leakage current compensation - contains tapping point with artificially raised potential achieved via one or more PN junctions

摘要

The circuit taps the leakage currents (IL,IB) via one or more electronic components (DV) acting as signal transducers at an artificially high potential. The potential at the tapping point is raised by the PN junction of one or more semiconductors. A photodiode in conjunction with x-ray signal amplifying material can be used as the signal transducer. USE/ADVANTAGE - The arrangement enables the sensitivity of radiation measurement devices with semiconducting detectors to be increased by more than 100 times. Semiconductor detector can be for computer tomography, X-ray exposure appts., X-ray beam measurement appts., dosimeter or photometer.