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Method of making dynamic random access memory cell having a SDHT structure

机译:具有SDHT结构的动态随机存取存储单元的制造方法

摘要

A SDHT structured DRAM Cell with a P type silicon substrate and a P well region with a first trench formed into the P well region and a CVD oxide film layer formed on the wall of the first trench is disclosed. A second trench is formed in the bottom of the first trench. A capacitive oxide film layer is formed on the CVD oxide film layer of the first trench and on the second trench with a conducting material filling the trenches to form an inside charge storage electrode. A N MOSFET is formed on the P well region near the first trench with the N MOSFET having a soure N+ region and a drain N+ region, each including a LDD region.
机译:公开了一种SDHT结构的DRAM单元,其具有P型硅基板和P阱区,其中第一沟槽形成在P阱区中,并且CVD氧化物膜层形成在第一沟槽的壁上。在第一沟槽的底部中形成第二沟槽。电容性氧化物膜层形成在第一沟槽的CVD氧化物膜层上和第二沟槽上,其中导电材料填充沟槽以形成内部电荷存储电极。在第一沟槽附近的P阱区域上形成N MOSFET,该N MOSFET具有酸性N +区域和漏极N +区域,均包括LDD区域。

著录项

  • 公开/公告号US5182224A

    专利类型

  • 公开/公告日1993-01-26

    原文格式PDF

  • 申请/专利权人 HYUNDAI ELECTRONICS INDUSTRIES CO. LTD.;

    申请/专利号US19910641621

  • 发明设计人 JAE W. KIM;IN S. CHUNG;

    申请日1991-01-16

  • 分类号H01L21/70;

  • 国家 US

  • 入库时间 2022-08-22 04:58:52

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