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THICKNESS MEASUREMENT METHOD USING COFOCAL POINT SCANNING SYSTEM LASER MICROSCOPE

机译:共焦点扫描系统激光显微镜测厚的方法

摘要

PURPOSE: To measure the thickness of a substance accurately by applying laser beams to two surfaces constituting the thickness of a target and then obtaining the difference of the peak positions of the reflection intensity. ;CONSTITUTION: By controlling X and Y stages 48, the two-dimensional image in a specific range of a sample 24 is captured. A cursor indication part 114 indicates the Y-axis position for measuring thickness on the image. A scan control and synchronization circuit 84 allows a scanner 50 to run in X-axis direction. A focus control circuit 80 moves an objective lens 22 by a small amount of distance each time for each scanning. With the detection signal output from a photo detector 28, the detection data for one line are stored 98 for each scanning. An operation circuit 122 stores the detection value in a memory 123 at specified positions A and B, obtains the Z-axis position indicating the peak according to the detection output being stored in the memory 123 after focusing travel from the scanning start position (highest position) set in Z-axis direction to the scanning end position (lowest position) ends, and then determines the difference as the thickness measurement value.;COPYRIGHT: (C)1994,JPO&Japio
机译:目的:通过向构成靶材厚度的两个表面施加激光束,然后获得反射强度的峰值位置之差,来精确测量物质的厚度。组成:通过控制X和Y平台48,在样本24的特定范围内捕获二维图像。光标指示部114指示用于测量图像上的厚度的Y轴位置。扫描控制和同步电路84允许扫描器50在X轴方向上运行。对于每次扫描,聚焦控制电路80每次将物镜22移动少量距离。利用从光检测器28输出的检测信号,针对每次扫描存储一行98的检测数据。运算电路122将检测值存储在指定位置A和B处的存储器123中,根据从扫描开始位置(最高位置)开始聚焦行进之后,根据存储在存储器123中的检测输出来获得指示峰值的Z轴位置。 )在Z轴方向上设置到扫描结束位置(最低位置)结束,然后将差值确定为厚度测量值。;版权:(C)1994,JPO&Japio

著录项

  • 公开/公告号JPH06265317A

    专利类型

  • 公开/公告日1994-09-20

    原文格式PDF

  • 申请/专利权人 ISHIKAWAJIMA HARIMA HEAVY IND CO LTD;

    申请/专利号JP19930076098

  • 发明设计人 IWASAKI YUKIHIRO;

    申请日1993-03-10

  • 分类号G01B11/06;

  • 国家 JP

  • 入库时间 2022-08-22 04:53:10

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