首页> 外国专利> ADJUSTING METHOD OF REFERENCE POSITION OF CCD CAMERA IN IC TESTING APPARATUS EQUIPPED WITH CCD CAMERA

ADJUSTING METHOD OF REFERENCE POSITION OF CCD CAMERA IN IC TESTING APPARATUS EQUIPPED WITH CCD CAMERA

机译:配备有CCD相机的IC测试装置中CCD相机参考位置的调整方法

摘要

PURPOSE: To simply and accurately adjust a reference position by a method wherein a contact chuck in which a counterbored hole having a strict fitting size has been formed is used as one part of a calibration jig. ;CONSTITUTION: A counterbored hole 54 having a strict fitting size to a circuilar jig 53 is formed in the central position of a contact chuck 52 for calibration. The counterbored hole 54 is connected to a suction hole used to suck an IC. Also the contact chuck 52 itself is fixed to an X-Y arm at an X-Y conveyance divide in a state that it has been positioned with high accuracy by means of a guide pin 51. When a calibration jig constituted in this manner and an operating program for calibration are used, the suction height of the IC on a buffer stage 2 and the relative relationship between a CCD camera 12 in a contact height and the suction center of the IC are measured. Then, a calibration operation is executed in respective heights.;COPYRIGHT: (C)1993,JPO&Japio
机译:用途:为了通过一种方法简单而准确地调整基准位置,在该方法中,使用已形成安装尺寸严格的沉头孔的接触卡盘作为校准夹具的一部分。组成:在接触卡盘52的中心位置形成一个对圆夹具53具有严格装配尺寸的沉孔54,以进行校准。 bor孔54连接到用于抽吸IC的抽吸孔。接触卡盘52本身也以导引销51以高精度定位的状态,以XY传送距离固定在XY臂上。以这种方式构成的校准夹具和用于校准的操作程序使用图1所示的IC,测量IC在缓冲台2上的抽吸高度以及CCD照相机12的接触高度与IC的抽吸中心之间的相对关系。然后,在各个高度上执行校准操作。版权所有:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH05297060A

    专利类型

  • 公开/公告日1993-11-12

    原文格式PDF

  • 申请/专利权人 ADVANTEST CORP;

    申请/专利号JP19920104707

  • 发明设计人 OSHIMA TAKASHI;KIYOKAWA TOSHIYUKI;

    申请日1992-04-23

  • 分类号G01R31/26;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-22 04:51:25

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