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REFLECTION FACTOR MEASURING DEVICE, REFLECTION FACTOR MEASURING METHOD, AND ROBOT DEVICE

机译:反射系数测量装置,反射系数测量方法和机器人装置

摘要

PURPOSE: To accurately measure the reflection factor and improve the reliability of an applied device by devising an optical system for the reflecting face of a measurement object, controlling the measuring position of the reflecting face, and collecting only the necessary reflection factor information in improving a reflection factor measuring device and a robot device. ;CONSTITUTION: A reflection factor measuring device is provided with a reflected light detecting means 11 radiating the measurement light L1 to a measurement object 14 from the vertical direction and detecting the regular reflected light L2, a driving means 12 shift-scanning the measurement object 14 or the reflected light detecting means 11, and a control means 13 controlling the inputs and outputs of the reflected light detecting means 11 and the driving means 12. The control means 13 also controls the positions of the detection area of the measurement object 14 and the acquisition area of the regular reflected light L2. A robot device is provided with a robot work section 15, a position detecting means 16, and a robot control means 17, and the position detecting means 16 is constituted of the reflection factor detecting device.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:通过为测量对象的反射面设计一个光学系统,控制反射面的测量位置,并仅收集必要的反射系数信息来改善反射率,从而准确地测量反射系数并提高应用设备的可靠性。反射率测量装置和机器人装置。 ;构成:反射率测量装置包括:反射光检测装置11,其从垂直方向向测量对象14辐射测量光L1,并检测正反射光L2;驱动装置12,对测量对象14进行移位扫描。或反射光检测装置11,以及控制装置13,控制反射光检测装置11和驱动装置12的输入和输出。控制装置13还控制测量对象14和检测物体14的检测区域的位置。正反射光L2的获取面积。机器人装置具有机器人工作部15,位置检测机构16和机器人控制机构17,该位置检测机构16由反射率检测机构构成。版权所有:(C)1993,日本特许厅&日本特刊

著录项

  • 公开/公告号JPH05322761A

    专利类型

  • 公开/公告日1993-12-07

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP19920126421

  • 发明设计人 OSAWA FUJIO;ANNO TAKAHIRO;

    申请日1992-05-19

  • 分类号G01N21/55;G01B11/30;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-22 04:47:03

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