首页> 外国专利> CHEMICAL MECHANICAL POLISHING EQUIPMENT FOR SEMICONDUCTOR WAFER, METHOD OF MOUNTING SEMICONDUCTOR WAFER POLISHING PAD ON PLATEN OF EQUIPMENT, AND POLISHING COMPOSITE PAD OF EQUIPMENT

CHEMICAL MECHANICAL POLISHING EQUIPMENT FOR SEMICONDUCTOR WAFER, METHOD OF MOUNTING SEMICONDUCTOR WAFER POLISHING PAD ON PLATEN OF EQUIPMENT, AND POLISHING COMPOSITE PAD OF EQUIPMENT

机译:半导体晶片的化学机械抛光设备,在设备平台上安装半导体晶片抛光垫的方法以及对设备的复合垫进行抛光的方法

摘要

PURPOSE: To provide an improved chemical mechanical polishing method, where trouble that two pads are suddenly separated off from each other is lessened in frequency of occurrence and slurry used for polishing is reduced in consumption in a polishing equipment. ;CONSTITUTION: A polishing equipment is equipped with a rotary platen 206 possessed of a surface, at least a polishing pad 208 (upper pad) possessed of a front surface which polishes a semiconductor wafer 220 and a rear surface which is bonded to the surface of the platen 206, and a bead 230 of gasket material which extends around the peripheral region of the polishing pad 208.;COPYRIGHT: (C)1994,JPO
机译:目的:提供一种改进的化学机械抛光方法,其中减少了两个垫突然彼此分离的麻烦,并且减少了抛光设备中消耗的抛光浆料的消耗。组成:抛光设备配备有具有表面的旋转压板206,至少具有抛光半导体晶片220的前表面和结合至硅晶片220表面的后表面的抛光垫208(上垫)。压板206和围绕抛光垫208的外围区域延伸的垫片材料的珠230。版权所有:(C)1994,JPO

著录项

  • 公开/公告号JPH0697132A

    专利类型

  • 公开/公告日1994-04-08

    原文格式PDF

  • 申请/专利权人 LSI LOGIC CORP;

    申请/专利号JP19930192736

  • 发明设计人 PASCH NICHOLAS F;

    申请日1993-07-07

  • 分类号H01L21/304;B24B1/00;

  • 国家 JP

  • 入库时间 2022-08-22 04:47:00

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