Device for testing electronic elements with loading station, test station and unloading station for the elements

摘要

The invention relates to an apparatus for testing electronic components, in particular IC's, having a transporting device to which holders for the components are detachably attached by fastening devices, and which is passed through a loading station to receive the components, a testing station to test the components and an unloading station to remove the components. To generally improve the functional efficiency of the apparatus and to carry out in particular the loading and unloading procedure with less danger of damaging the components, it is proposed according to the invention to provide that the holder, together with the components, can be attached to the transporting device in the loading station and be removed therefrom in the unloading station.