Method and apparatus for non-destructive determination of the thickness of deposited mineral coatings and/or the determination of the position of materials underlying such mineral layers

摘要

Together with associated means, a method is made available which is suitable for non-destructive determination of the thickness of applied mineral layers and/or for non-destructive determination of the position of materials laid underneath the mineral layer. When this method is carried out, at least one electrically insulated conductor, referred to below for brevity as a metal conductor, is positioned on the substrate before the application of a mineral layer, and an electric signal is fed into or induced in the metal conductor subsequently after the application of the mineral layer. The signal emitted by the metal conductors is detected on the top side of the mineral layer by a receiver, and the thickness of the mineral layer and/or the position of the materials laid underneath the applied mineral layer is determined from the propagation time and/or the absorption. IMAGE