Comparator for verifying characteristics of IC monoliths - compares all IC devices with those of reference IC either manually or to PC programme with output to plotter

摘要

The measurement device for verifying the characteristics of IC monoliths using comparisons with a standard reference IC has a test module (m) incorporating a test socket (p) for connecting the IC sample to be checked (P) and a socket (r) for accepting the reference IC (R). A multi-stage circuit selection and changeover array (u1, u1', u2, u2', u3) enables each IC connection in turn for both sample (P) and reference (R) to be subjected to a fixed/variable test voltage (h) either by PC programme and times (tg) or manually (tt). Successive connections are indicated by the LED display (w), and their voltage/current characteristics are observable at the plotter (g). USE/ADVANTAGE - Enables comprehensive testing of ICs by semi-skilled personnel in a simple way which minimises concentration, fatigue and time.