Method and apparatus for the perspective thick measurement

摘要

a schichtdickenmeu00dfvorrichtung or a measuring probe for a schichtdickenmeu00dfvorrichtung and a procedure for schichtdickenmessung allows the measurement of both layers on ferrous substrates nonferrous as well as non managerial layers on conductive substrates. this is the schichtdickenmeu00dfvorrichtung orthe measuring probe in such a way that the substrateigenschaften with a single probe and a schichtdickenmessung determined automatically on the characterized substrate is carried out.for the measurement of film thickness on a ferrous substrate used in the invention a permanent magnets (30), and a hall sensor (50), and a thermistor (40) which are arranged at a magnetic flux density in a temperaturkorrigierte pole of the permanent magnets (30). mood, and the flux density, the thickness of said.for the measurement of non - conductive layers on a conductive substrate is the use of the invention wirbelstromeffekte. a coil induces eddy currents in the surface of the conductive substrate.the resulting eddy currents generate a magnetic field opposite to the means, which in turn influence the driven coil, and this wirbelstromeffekte in relation with the thickness of be (fig. 1).