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Deposition chamber for deposition of particles on semiconductor wafers

机译:沉积室,用于在半导体晶片上沉积颗粒

摘要

A deposition chamber for forming a deposited layer on a wafer having a mixing chamber is disclosed having a wafer support device for supporting the wafers in the mixing chamber, a nozzle located above the wafer support device which can eject the gas/particle mixture into the mixing chamber toward the wafer, a gas outlet device at the bottom end of the chamber from the gas nozzle which allows the gas to exit the chamber and a deionizing device located above the wafer support device and below the nozzle to deionize the gas/particle mixture thereby encouraging uniform deposition of the particles on the wafer. This deposition chamber may also comprise an exhaust fan below the gas outlet device.
机译:公开了一种用于在具有混合室的晶片上形成沉积层的沉积室,其具有用于在混合室中支撑晶片的晶片支撑装置,位于晶片支撑装置上方的喷嘴,该喷嘴可以将气体/颗粒混合物喷射到混合中腔室朝向晶片,在腔室底端的气体出口装置从气体喷嘴排出气体,该气体出口装置允许气体离开腔室,而去离子装置位于晶片支撑装置上方且在喷嘴下方以使气体/颗粒混合物去离子促进颗粒在晶片上的均匀沉积。该沉积室还可在气体出口装置下方包括排气扇。

著录项

  • 公开/公告号US5306345A

    专利类型

  • 公开/公告日1994-04-26

    原文格式PDF

  • 申请/专利权人 PARTICLE SOLUTIONS;

    申请/专利号US19920935043

  • 发明设计人 CRAIG DONALDSON;CARRIE PELLET;

    申请日1992-08-25

  • 分类号B05B15/06;

  • 国家 US

  • 入库时间 2022-08-22 04:31:51

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