首页> 外国专利> Assembly for simultaneous observation and laser interferometric measurements, in particular on thin-film structures

Assembly for simultaneous observation and laser interferometric measurements, in particular on thin-film structures

机译:用于同时观察和激光干涉测量的组件,特别是在薄膜结构上

摘要

Assembly for observation and laser interferometric measurements of articles contained in an enclosure includes a video camera and a laser emitter unit. The laser emitter unit has two laser diodes whose beams follow the optical path of the video camera. An illumination system also follows the optical path of the video camera. The entire assembly is incorporated into a single box. The assembly is utilized for the observation and measurement of thin-film structures, in particular integrated-circuit boards.
机译:用于对容纳在外壳中的物品进行观察和激光干涉测量的组件,包括摄像机和激光发射器单元。激光发射器单元有两个激光二极管,其光束遵循摄像机的光路。照明系统也遵循摄像机的光路。整个组件被合并到一个盒子中。该组件用于观察和测量薄膜结构,特别是集成电路板。

著录项

  • 公开/公告号US5355217A

    专利类型

  • 公开/公告日1994-10-11

    原文格式PDF

  • 申请/专利权人 SOFIE;

    申请/专利号US19920930243

  • 发明设计人 JEAN CANTELOUP;JACKY MATHIAS;

    申请日1992-08-14

  • 分类号G01B9/02;

  • 国家 US

  • 入库时间 2022-08-22 04:31:00

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