首页> 外国专利> PLASMA FOR PREPARING SEMICONDUCTOR, AND METHOD FOR TREATING WORKPIECE BY USING PROCESS REACTION APPARATUS HAVING AND PLASMA IGNITING APPARATUS AND INDUCTION COUPLING APPARATUS

PLASMA FOR PREPARING SEMICONDUCTOR, AND METHOD FOR TREATING WORKPIECE BY USING PROCESS REACTION APPARATUS HAVING AND PLASMA IGNITING APPARATUS AND INDUCTION COUPLING APPARATUS

机译:用于制备半导体的等离子体,以及使用过程反应装置,等离子体点火装置和感应耦合装置处理工件的方法

摘要

PURPOSE: To lessen the damage of an integrated circuit on a workpiece by treating plasma by generating plasma by using an ignition electrode and applying electric power to a gas and positioning an antenna coil for coupling energy with the plasma in order to retain the plasma. ;CONSTITUTION: After a chamber 13 is evacuated by a highly vacuum apparatus 28, argon is introduced into the resultant chamber from an argon gas source 29 until the pressure of the chamber reaches 1 mtorr. High frequency power is applied to an ignition electrode 31 through an inductance 32 and a capacitor 33 to generate plasma in the chamber 13. On the other hand, high frequency power from a high frequency generator 38 is supplied to a multi-wound antenna coil to effectively carry out induction coupling of the electric energy with plasma. Plasma treatment for a wafer 17 on a wafer supporting body 19 is carried out using the plasma.;COPYRIGHT: (C)1995,JPO
机译:目的:通过使用点火电极产生等离子体并向气体施加电能,并放置天线线圈以将能量与等离子体耦合以保留等离子体,从而通过处理等离子体来减轻集成电路对工件的损害。组成:在通过高真空设备28将腔室13抽空后,将氩气从氩气源29引入所得腔室中,直到腔室的压力达到1毫托。高频功率通过电感32和电容器33施加到点火电极31,以在腔室13中产生等离子体。另一方面,来自高频发生器38的高频功率被提供给多绕天线线圈,以将其产生。有效地实现了电能与等离子体的感应耦合。使用等离子体对晶片支撑体19上的晶片17进行等离子体处理。版权所有:(C)1995,JPO

著录项

  • 公开/公告号JPH07183097A

    专利类型

  • 公开/公告日1995-07-21

    原文格式PDF

  • 申请/专利权人 APPLIED MATERIALS INC;

    申请/专利号JP19940260301

  • 发明设计人 HANAWA HIROJI;

    申请日1994-10-25

  • 分类号H05H1/46;C23F4/00;H01L21/205;H01L21/3065;

  • 国家 JP

  • 入库时间 2022-08-22 04:26:38

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