METHOD FOR MEASURING FILM THICKNESS OF FINE-POWDER LAMINATED LAYER USING FILM THICKNESS INDICATOR

摘要

PURPOSE: To measure the thickness of the film of an unstable fine-powder laminated layer by laminating fine powder on a basis material, on which a film thickness indicator is provided, and comparing the film of the laminated layer and the film of the laminated layer on the film thickness indicator. ;CONSTITUTION: For example, a thin film indicator 10 utilizing the change in hue is constituted so that the film thickness is indicated based on the change in brightness caused by the film thickness or the change in hiding power by coloring the surface of a metallic or nonmetallic thin plate having the thickness of about 1-5 mm with one color or two or more colors. The film thickness indicator 10 is provided on a basis material 2. In the indicator 10, the relation with the degree of brightness change based on the film thickness or the hiding power is obtained beforehand with respect to the standard color, whose brightness is measured beforehand or the surface hue of the basis material 2. After the film is formed, the brightness of the film surface is measured, and the rising degree of the brightness and the hiding power are obtained. The values are compared with the curve for relationship between the film thickness and the rising rate of the brightness or the curve for the relationship between the film thickness and the hiding power, which is obtained beforehand, and the film thickness is obtained.;COPYRIGHT: (C)1995,JPO