首页> 外国专利> SLANT POSITION DETECTING DEVICE UTILIZING FRESNEL DIFFRACTION BASED ON MULTIPLE-WAVE LENGTH COHERENT LIGHT

SLANT POSITION DETECTING DEVICE UTILIZING FRESNEL DIFFRACTION BASED ON MULTIPLE-WAVE LENGTH COHERENT LIGHT

机译:基于多波长相干光的菲涅耳衍射倾斜位置检测装置

摘要

PURPOSE:To simplify a detecting mark by providing the alignment mark comprising a linear Fresnel zone plate on each body, and constituting a lighting device so that the linear Fresnel zone plate is lit at the same time with the lights having a plurality of wavelengths. CONSTITUTION:Two LFZP, which are alignment marks 28 for wafers 15 are provided on both sides of a linear Fresnel zone plate (LFZP herein, which is an alignment mark 27 for an X-ray mask 14 at the center. The LFZP 28 is observed through a transparent window 22 of the X-ray mask 14 arranged at the upper side. Therefore, the illuminating lights with a plurality of coherent lights can be utilized. The defect of the image focusing in the slant direction is overcome by inclining the objective lens having the single focal point and performing the slant detection. In the alignment device, wherein the Fresnel diffraction wit the multiple-wavelength coherent light is utilized, the constitution of the detecting mark becomes simple, and the image, which is equivalent to the vertical image focusing, is obtained.
机译:目的:通过提供对准标记,以简化检测标记,该对准标记包括在每个主体上的线性菲涅耳波带片,并构成照明装置,使得线性菲涅耳波带片与具有多个波长的光同时点亮。组成:两个LFZP,它们是晶片15的对准标记28,设置在线性菲涅耳波带片的两侧(此处为LFZP,它是中心处的X射线掩模14的对准标记27。观察到LFZP 28通过布置在上侧的X射线掩模14的透明窗口22,因此,可以利用具有多个相干光的照明光,通过倾斜物镜来克服在倾斜方向上聚焦的图像的缺陷。具有单一焦点并进行倾斜检测的对准装置,在利用菲涅耳衍射和多波长相干光的情况下,检测标记的构成变得简单,相当于垂直图像的图像。获得聚焦。

著录项

  • 公开/公告号JPH06326006A

    专利类型

  • 公开/公告日1994-11-25

    原文格式PDF

  • 申请/专利权人 SUMITOMO HEAVY IND LTD;

    申请/专利号JP19930135186

  • 发明设计人 MIYATAKE TSUTOMU;

    申请日1993-05-14

  • 分类号H01L21/027;G01B11/00;G03F9/00;

  • 国家 JP

  • 入库时间 2022-08-22 04:22:25

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