首页> 外国专利> METHOD AND EQUIPMENT FOR MEASURING CRITICAL MICELL CONCENTRATION(CMC)

METHOD AND EQUIPMENT FOR MEASURING CRITICAL MICELL CONCENTRATION(CMC)

机译:临界胶束浓度(CMC)的测量方法和设备

摘要

PURPOSE: To provide method and equipment for measuring the transport number simultaneously with the critical micell concentration by measuring the liquid junction potential at the interface formed by a glass sleeve. ;CONSTITUTION: Surfactant ions form an association at a specified concentration or above and the mobility thereof varies significantly before and after a CMC value. Corresponding variation of liquid junction potential is observed as a function of activator ion concentration thus determining a CMC value and the transport number of activator ion. More specifically, the surfactant ion concentration of a surfactant solution S1 is fixed below the CMC value and then the surfactant ion concentration of a surfactant solution S2 is varied to induce a liquid junction potential in a slit B which is measured by means of a voltmeter V through a metal electrode A.;COPYRIGHT: (C)1995,JPO
机译:目的:提供通过测量由玻璃套筒形成的界面处的液体结合电位,在临界胶束浓度的同时测量传输数的方法和设备。 ;组成:表面活性剂离子在指定浓度或以上时形成缔合,其迁移率在CMC值之前和之后发生显着变化。观察到液体结电位的相应变化是活化剂离子浓度的函数,从而确定了CMC值和活化剂离子的迁移数。更具体地,将表面活性剂溶液S 1 的表面活性剂离子浓度固定为低于CMC值,然后改变表面活性剂溶液S 2 的表面活性剂离子浓度以诱导缝隙B中的液体结电势,该电压是通过电压表V通过金属电极A测量的;版权:(C)1995,JPO

著录项

  • 公开/公告号JPH0735720A

    专利类型

  • 公开/公告日1995-02-07

    原文格式PDF

  • 申请/专利权人 YAMAUCHI AKIRA;ERI HIROSHI;

    申请/专利号JP19920358896

  • 发明设计人 YAMAUCHI AKIRA;

    申请日1992-12-09

  • 分类号G01N27/26;

  • 国家 JP

  • 入库时间 2022-08-22 04:21:52

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号