首页> 外国专利> DEVICE FOR DETECTING ELEMENT OF EXTREMELY LOW CONCENTRATION BY ATOMIC EMISSION SPECTROMETRY

DEVICE FOR DETECTING ELEMENT OF EXTREMELY LOW CONCENTRATION BY ATOMIC EMISSION SPECTROMETRY

机译:原子发射光谱法检测极低浓度元素的装置

摘要

PURPOSE: To provide a spectrometric low voltage lamp device with a low detection limit further exceeding the detection limit obtained by a conventional device for introducing a microwave through a coaxial cable. ;CONSTITUTION: A microwave generating source 9 is mounted on the large walls 2, 3 of a parallelepiped chamber 1 with an antenna 10 being protruded to the interior side by a distance equal to 1/3 of a microwave wavelength, and a negative electrode 7 is mounted on the large walls 2, 3 with a space from small walls 4, 5 by the distance equal to 0.930 times the wavelength.;COPYRIGHT: (C)1994,JPO
机译:用途:提供一种光谱检测低压灯装置,其检测限低,进一步超过了通过同轴电缆引入微波的常规装置所获得的检测限。组成:微波产生源9安装在平行六面体腔室1的大壁2、3上,天线10朝内侧突出等于微波波长1/3的距离,负电极7安装在大壁2、3上,与小壁4、5之间的距离等于波长的0.930倍。;版权:(C)1994,JPO

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号