首页> 外国专利> Method for comparing a test line of a plotter pen with a subsequent plot line.

Method for comparing a test line of a plotter pen with a subsequent plot line.

机译:将绘图笔的测试线与后续绘图线进行比较的方法。

摘要

SE shows a method of comparing a test line A PRINTER tip of a plotter WITH A LINE LAYOUT SUBSEQUENT TO COMPARE SELECTED POINT LAY LINE WITH REFERENCE FOR DIRECT IMPRESSION said tip. EVERY POINT OF IMPRESSION OF A SERIES PLOTTER SCORING by controlling the contrast ratio PRINTING MULTIPLE POINTS TAKEN FROM PARTS AND VERTICAL HORIZONTAL LINE DRAWN BY SAMPLE PRINTER PUNTA. A RECORD CONTINUES TO INDICATE THE GOOD OR BAD QUALIFICATION OF EACH POINT IN THE SERIES PRINTERS AND PROPER FOR EACH REFERENCE POINT FOR FUTURE REFERENCE PRINTER recorded. COMPARING THE CONTRAST RATIO Printing a sequence selected points on a line CURRENT LAYOUT WITH BENCHMARK FOR PERFORMING THE PRINTER PUNTA LAYOUT, you can periodically check POINT FUNCTION PRINTER.
机译:SE示出了一种方法,将绘图仪的测试线A打印机尖端与线布局进行比较,以比较所选择的点布局线,并直接参考所述尖端。通过控制对比度来打印系列绘图仪刻痕的每个点,将零件上的多个点和垂直打印机绘制的水平线绘制在打印机上。记录继续表明系列打印机中每个点的优劣,并且适当记录每个将来参考打印机的参考点。比较对比度比率在带有基准的行当前布局上打印序列选择的点,以执行打印机打孔布局,您可以定期检查“点功能打印机”。

著录项

  • 公开/公告号ES2075989T3

    专利类型

  • 公开/公告日1995-10-16

    原文格式PDF

  • 申请/专利权人 HEWLETT-PACKARD COMPANY;

    申请/专利号ES19920115811T

  • 申请日1992-09-16

  • 分类号G01D15/16;B43L13/02;G06K15/22;

  • 国家 ES

  • 入库时间 2022-08-22 04:16:33

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号