首页> 外国专利> A method of etching MoSi 2 (molybdenum silicide) using SF 6 (sulfur hexafluoride), HBr (hydrogen bromide) and O 2 (oxygen)

A method of etching MoSi 2 (molybdenum silicide) using SF 6 (sulfur hexafluoride), HBr (hydrogen bromide) and O 2 (oxygen)

机译:一种使用SF 6(六氟化硫),HBr(溴化氢)和O 2(氧)蚀刻MoSi 2(硅化钼)的方法

摘要

The present invention seeks to provide a method for selectively etching a substrate (20) having a layer (25) of molybdosilicate silicide with a resist (26) at the top. This substrate 26 is disposed in the etching zone 54,6(6 fluorinated type) and HBr (hydrogen bromide)-containing process gas are injected into the etching zone 54. Preferably, SF6: HBr is 1: 10 to 1: 1, and more preferably, the volume ratio of O2Oxygen is added. MoSi with excellent selectivity and reduced cross-sectional microloadxPlasma is generated in the anchoring zone 54 to produce etch gas from the process gas that etches the layer anisotropically.
机译:本发明寻求提供一种方法,用于选择性地蚀刻具有在顶部具有抗蚀剂(26)的硅钼酸硅化物层(25)的衬底(20)。将该基板26配置在蚀刻区域54中,将 6 (6氟化型),含HBr(溴化氢)的处理气体注入到蚀刻区域54中。优选地,SF 6 < / Sub>:HBr为1:10〜1:1,更优选添加O 2 氧气的体积比。在锚定区54中产生具有优异的选择性和减小的横截面微载荷 x 等离子的MoSi,以从各向异性蚀刻该层的工艺气体中产生蚀刻气体。

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