首页> 外国专利> Litter light measuring arrangement for the investigation of the surface roughness

Litter light measuring arrangement for the investigation of the surface roughness

机译:垃圾光测量装置,用于调查表面粗糙度

摘要

The light scattered from the sample (12) is incident on an array of detectors on a curved, possibly semicircular, carrier (17). The detectors are positioned so that their geometrical arrangement corresponds to equidistant intervals in the spatial frequency range of the sample. USE - Measuring spatially dependent roughness of optically flat surfaces.
机译:从样品(12)散射的光入射在弯曲的,可能是半圆形的载体(17)上的检测器阵列上。放置检测器的位置应使其几何结构对应于样品空间频率范围内的等距间隔。用途-测量光学平面的空间粗糙度。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号