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Method and apparatus for testing of tri - state - drivers.

机译:用于测试三态驱动器的方法和装置。

摘要

In an integrated circuit chip utilizing CMOS technology, an embedded data bus is driven by embedded three state drivers, and the bus is in turn connected to provide a drive signal to embedded receivers and similar logic devices. An embedded threshold detector is provided to detect the occurrence of any invalid data signal (i.e. a non-"0" or a non- "1" signal level) on the data bus. The threshold detector's output signal is connected to off chip terminal means, to thereby enable off chip monitoring of the bus signal. The threshold detector's output signal is also ANDed with the bus signal, to thereby prevent the application of a potentially destructive invalid bus signal to the receivers and the like. Terminator circuit means provides a known invalid signal state on the bus when the bus is in its high impedance state due to all of the three state drivers being disabled.
机译:在利用CMOS技术的集成电路芯片中,嵌入式数据总线由嵌入式三态驱动器驱动,并且该总线又被连接以向嵌入式接收机和类似逻辑器件提供驱动信号。提供了嵌入式阈值检测器,以检测数据总线上任何无效数据信号(即非“ 0”或非“ 1”信号电平)的出现。阈值检测器的输出信号连接到片外终端装置,从而能够对总线信号进行片外监视。阈值检测器的输出信号也与总线信号进行“与”运算,从而防止将潜在破坏性的无效总线信号施加到接收器等。当总线由于其三个状态驱动器均被禁用而处于其高阻抗状态时,终端电路装置在总线上提供已知的无效信号状态。

著录项

  • 公开/公告号DE68916106T2

    专利类型

  • 公开/公告日1995-01-12

    原文格式PDF

  • 申请/专利权人 IBM US;

    申请/专利号DE1989616106T

  • 申请日1989-03-14

  • 分类号G01R31/28;G06F11/26;

  • 国家 DE

  • 入库时间 2022-08-22 04:08:36

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