首页> 外国专利> A device for evaluating the time of propagation of the signals to the inside of an integrated circuit.

A device for evaluating the time of propagation of the signals to the inside of an integrated circuit.

机译:一种用于评估信号传播到集成电路内部时间的设备。

摘要

The invention relates to a device for evaluating a coefficient representing the signal propagation time within an integrated circuit, characterised in that it comprises: - means (12) for applying a variable delay to a first signal (11), the said variable delay consisting of a variable number of elementary delays, the said application means (12) delivering a delayed signal (13); - means (14) for checking the number of elementary delays forming the said variable delay, so that the duration of the said variable delay is substantially equal to a predetermined reference duration; the said coefficient being substantially proportional to the said number of elementary delays. IMAGE
机译:本发明涉及一种用于评估代表信号在集成电路内传播时间的系数的装置,其特征在于,该装置包括:-用于向第一信号(11)施加可变延迟的装置(12),所述可变延迟包括:可变数量的基本延迟,所述施加装置(12)传递延迟信号(13); -装置(14),用于检查形成所述可变延迟的基本延迟的数量,以使所述可变延迟的持续时间基本上等于预定参考持续时间;所述系数基本上与所述基本延迟的数量成比例。 <图像>

著录项

  • 公开/公告号FR2703533B1

    专利类型

  • 公开/公告日1995-05-12

    原文格式PDF

  • 申请/专利权人 CIT ALCATEL;

    申请/专利号FR19930003767

  • 发明设计人 PIERRE ALBOUY;GERARD CHARTIE;

    申请日1993-03-31

  • 分类号H03K17/14;H03K19/0948;

  • 国家 FR

  • 入库时间 2022-08-22 04:07:08

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