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DRAM having bidirectional global bit lines

机译:具有双向全局位线的DRAM

摘要

A DRAM having bidirectional global bit lines is defined such that local bit lines connected to corresponding memory cells and separative global bit lines connected to the local bit lines are commonly connected to local bit lines so as to read data stored in the cells or write data to the cells in a bidirectional data access manner. According to the DRAM of the present invention, the sense amplifiers, input and output lines and switching elements for column decoding, which generally are located between adjacent cell arrays, can be advantageously positioned without decreasing the characteristics of the DRAM element. In addition, the DRAM of the present invention employs an open bit line structure rather than a folded bit line structure, thereby improving a packing effect as well as a S/N (signal-to-noise) characteristic, remarkably.
机译:定义具有双向全局位线的DRAM,使得连接到相应存储单元的本地位线和连接到本地位线的分离全局位线共同连接到本地位线,以便读取存储在单元中的数据或将数据写入到存储单元。单元以双向数据访问的方式。根据本发明的DRAM,可以有利地定位通常位于相邻单元阵列之间的读出放大器,输入和输出线以及用于列解码的开关元件,而不会降低DRAM元件的特性。另外,本发明的DRAM采用开放位线结构而不是折叠位线结构,从而显着改善了封装效果以及S / N(信噪比)特性。

著录项

  • 公开/公告号US5367488A

    专利类型

  • 公开/公告日1994-11-22

    原文格式PDF

  • 申请/专利权人 GOLDSTAR ELECTRON CO. LTD.;

    申请/专利号US19930033716

  • 发明设计人 JIN H. AN;

    申请日1993-03-18

  • 分类号G11C7/00;

  • 国家 US

  • 入库时间 2022-08-22 04:05:50

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