首页> 外国专利> Eye examining apparatus including an eye refraction measuring system and eye fundus examining system

Eye examining apparatus including an eye refraction measuring system and eye fundus examining system

机译:眼检查装置,包括眼屈光测量系统和眼底检查系统

摘要

The present invention relates to an eye examining apparatus used in ophthalmic clinics. In an eye refractometer provided with a light beam separating member for separating an eye fundus illuminating light beam and an imaging light beam through an objective lens in a position conjugate with the pupil of an eye to be examined, an eye refraction measuring light beam is projected to the fundus of the eye to be examined through an optical passage dividing member arranged between the aforesaid objective lens and the aforesaid light beam separating member in order to obtain the refractive value of the eye to be examined by receiving the aforesaid measuring light beam including at least three meridians using a photoelectric sensor.
机译:眼科检查设备技术领域本发明涉及眼科诊所中使用的眼科检查设备。在具有用于将眼底照明光束和成像光束通过物镜分离在与被检眼的瞳孔共轭的位置的光束分离构件的眼睛折射仪中,投射了眼睛折射测量光束。通过设置在上述物镜和上述光束分离构件之间的光路分离构件将光照射到被检眼的眼底,以便通过接收包括以下在内的上述测量光束来获得被检眼的屈光值:至少三个子午线使用光电传感器。

著录项

  • 公开/公告号US5420650A

    专利类型

  • 公开/公告日1995-05-30

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号US19930095219

  • 发明设计人 YOSHIMI KOHAYAKAWA;

    申请日1993-07-23

  • 分类号A61B3/10;

  • 国家 US

  • 入库时间 2022-08-22 04:04:55

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