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Method and apparatus for inspecting parts for dimensional accuracy outside a laboratory environment

机译:在实验室环境之外检查零件尺寸精度的方法和设备

摘要

Accurate measurements of production parts are obtained from a system which includes a first measuring apparatus in a laboratory, and a second measuring apparatus which is in a non-laboratory environment where it is subjected to greater temperature fluctuations than in the laboratory. A reference part of substantially the same size and shape as the production parts is inspected by both measuring apparatuses, and the production part is inspected by the second measuring apparatus. While being inspected, both parts occupy substantially the same location on the second measuring apparatus. Results of these inspections are processed by a computer to provide (1) target values which the shop machine would perceive when inspecting a perfect part as specified by the part drawings, or (2) values which indicate what the laboratory machine would perceive for the production part.
机译:可以从系统获得准确的生产零件测量结果,该系统包括一个实验室中的第一测量设备和一个非实验室环境中的第二测量设备,在非实验室环境中,该设备承受的温度波动要大于实验室中的温度波动。与尺寸和形状基本相同的基准部件由两个测量设备检查,并且生产部件由第二测量设备检查。在检查时,两个零件在第二测量设备上基本上占据相同的位置。这些检查的结果由计算机处理,以提供(1)车间机器在检查零件图纸指定的完美零件时将感知的目标值,或(2)指示实验室机器对于生产将感知的目标值部分。

著录项

  • 公开/公告号US5426861A

    专利类型

  • 公开/公告日1995-06-27

    原文格式PDF

  • 申请/专利权人 ADVANCED METROLOGICAL DEVELOPMENT;

    申请/专利号US19930047414

  • 发明设计人 RUSSELL S. SHELTON;

    申请日1993-04-19

  • 分类号G01B5/03;

  • 国家 US

  • 入库时间 2022-08-22 04:04:48

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