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DEFECT INSPECTION METHOD FOR DEFECT OF BOTTLE NECK OPENING TOP

机译:瓶颈开口顶部缺陷的缺陷检查方法

摘要

PURPOSE: To provide an inspection method for a defect on a bottle neck opening top, having the capability of automatically and continuously inspecting a defect such as a top extrusion, a top flow, a bubble, a flaw and a streak at low cost and stably. ;CONSTITUTION: A bottle as an inspection object is placed at an inspection position and rotated with a rotation means. Also, a CCD image sensor 5 is laid around the bottle as a center, viewed from a bottle neck opening top 1, and projectors are provided at the side of the sensor 5, at a position faced thereto, and at the right and left sides or one side of the position. Then, the image sensor 5 and the projectors are kept at a projection angle for a horizontal plane, so as to allow the observation of an edge inside the bottle, and a defect is detected under light emitted from the projectors.;COPYRIGHT: (C)1996,JPO
机译:目的:提供一种用于瓶颈开口顶部的缺陷的检查方法,其能够自动且连续地以低成本且稳定地检查诸如顶部挤压,顶部流动,气泡,缺陷和条纹的缺陷。 。 ;组成:将作为检查对象的瓶子放在检查位置,并用旋转装置旋转。而且,从瓶颈开口顶部1看,CCD图像传感器5以瓶子为中心放置,并且在传感器5的侧面,面对它的位置以及在左侧和右侧设置有投影仪。或位置的一侧。然后,将图像传感器5和投影仪保持在水平面的投影角度,以便观察瓶子内部的边缘,并在从投影仪发出的光下检测到缺陷。 1996年,日本特许厅

著录项

  • 公开/公告号JPH08278113A

    专利类型

  • 公开/公告日1996-10-22

    原文格式PDF

  • 申请/专利权人 HIUGA KUNIO;

    申请/专利号JP19950108279

  • 发明设计人 HIUGA KUNIO;

    申请日1995-04-06

  • 分类号G01B11/24;G01N21/90;

  • 国家 JP

  • 入库时间 2022-08-22 04:03:01

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