首页> 外国专利> Dielectric material quorum measurement equipment and dielectric material quorum measuring method

Dielectric material quorum measurement equipment and dielectric material quorum measuring method

机译:电介质材料定额测定装置及电介质材料定额测定方法

摘要

PURPOSE:To heat a dielectric sample continuously in high efficiency and thereby to enable measurement of a constant of a dielectric material in a short time by disposing the sample in a shield case, by injecting a power of a high frequency being the same with a resonance frequency and by heating the sample in a resonance mode. CONSTITUTION:A control device 45 measures a temperature T1 of a dielectric sample 16 before heating by a temperature sensor 44 and stores it. A switch 58 being closed, subsequently, a dielectric resonator 12 is made to resonate and a frequency F1 is measured and stored. The switch 58 being opened, thereafter, the frequency F1 is generated from a signal generator 46 and the sample 16 is heated. The temperature thereof is measured after a prescribed time and high-frequency heating is repeated until a prescribed temperature T2 is reached, with the switch 58 opened and closed and with the resonance frequency checked. When the resonance frequency at the temperature T2 is stored as F2, a temperature coefficient eta1 of the frequency of the sample can be calculated from the F2 and the resonance frequency F1 at the temperature T1, as (1/F1)(F2 - F1)/(T2 - T1).
机译:用途:通过连续注入高效率的能量,以高效率连续加热电介质样品,从而能够在短时间内测量电介质材料的常数,方法是将样品放置在屏蔽盒中频率,并以共振模式加热样品。构成:控制装置45在温度传感器44加热之前测量并存储电介质样品16的温度T1。闭合开关58,随后使介电谐振器12谐振,并测量并存储频率F1。断开开关58,此后,从信号发生器46产生频率F1,并加热样品16。在规定时间之后测量其温度,并重复高频加热直到达到规定温度T2,同时打开和闭合开关58,并检查谐振频率。当将温度T2处的共振频率存储为F2时,可以根据F2和温度T1处的共振频率F1计算出样品频率的温度系数eta1为(1 / F1)(F2-F1) /(T2-T1)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号