首页> 外国专利> ANALYZING METHOD FOR IMPURITY IN ORGANIC METAL COMPOUND AND DECOMPOSING DEVICE FOR IMPURITY ANALYSIS

ANALYZING METHOD FOR IMPURITY IN ORGANIC METAL COMPOUND AND DECOMPOSING DEVICE FOR IMPURITY ANALYSIS

机译:有机金属化合物中杂质的分析方法及杂质分析分解装置

摘要

PURPOSE: To provide a method for accurately analyzing organic compounds as impurities by subjecting an organic metal compound as an object to be inspected to a hydrolysis and provide a decomposing device for analysis of impurtities. ;CONSTITUTION: An object to be inspected 35 consists of an organic metal compound which contains organic compounds as impurities is put in a vessel 30, to which an inert gas is fed, and the object 35 is led together with the inert gas to a hydrolyzing chamber which is in connection with the vessel 30. The organic compounds gasified in this chamber 40 and segregated from the object 35 is adsorbed together with the inert gas to a column in a gas collecting pipe 18 and desorbed by a heating introducing device 64, and the concentration of the organic compounds is determined by a gas chromatography 6-5.;COPYRIGHT: (C)1996,JPO
机译:目的:提供一种通过对作为检查对象的有机金属化合物进行水解来准确地分析作为杂质的有机化合物的方法,并提供一种用于分析杂质的分解装置。 ;组成:待检查物体35由包含有机化合物作为杂质的有机金属化合物放入容器30中,向容器中注入惰性气体,并且将物体35与惰性气体一起引导至水解与容器30相连的腔室。在该腔室40中气化并与物体35分离的有机化合物与惰性气体一起被吸收到集气管18中的塔上,并通过加热引入装置64解吸。有机化合物的浓度用气相色谱法6-5测定。版权所有:(C)1996,日本特许厅

著录项

  • 公开/公告号JPH08101174A

    专利类型

  • 公开/公告日1996-04-16

    原文格式PDF

  • 申请/专利权人 SHIN ETSU CHEM CO LTD;

    申请/专利号JP19940235599

  • 发明设计人 SAITO SHIGE;OSHIMA MITSUYOSHI;

    申请日1994-09-29

  • 分类号G01N30/06;G01N30/04;G01N30/08;G01N30/32;G01N30/46;

  • 国家 JP

  • 入库时间 2022-08-22 03:59:35

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