首页> 外国专利> Surface roughness measurement modulo of the honeycomb and the gauge head null for surface roughness measurement which is used for

Surface roughness measurement modulo of the honeycomb and the gauge head null for surface roughness measurement which is used for

机译:蜂窝和表头的表面粗糙度测量模为零,用于测量表面粗糙度

摘要

PURPOSE:To adequately measure the roughness of an end surface of the honeycomb which has plural cell walls by tracing cell walls of at least =2 cells by using a probe in a special shape. CONSTITUTION:A honeycomb structure 3 is mounted on a slanting adjustment base 2 so that its honeycomb cut surface whose surface roughness in to be measured faces up. Then the cut surface of the structure 3 is set parallel to the moving direction of the probe 5 by the adjustment base 2 and then the probe 6 which has a specific tip structure is set on the end surface to be mea sured. Then the end surface of the honeycomb structure 3 is traced by the probe 6 through the driving of a driving device 4 to measure its up-down move ment quantity by a probe 5. Then the measured movement quantity is supplied to a control/arithmetic unit 7 nd processed, and the result is recorded on a recording device 8 to measure the surface roughness.
机译:目的:通过使用特殊形状的探针跟踪至少> = 2个单元的单元壁,以充分测量具有多个单元壁的蜂窝端面的粗糙度。组成:蜂窝结构3安装在倾斜的调整基座2上,以使其蜂窝切割表面的表面粗糙度要朝上。然后,通过调节基座2将结构3的切割面设定为与探针5的移动方向平行,然后将具有特定的尖端结构的探针6设置在要测量的端面上。然后,通过驱动装置4的驱动,通过探针6追踪蜂窝状结构体3的端面,并通过探针5测定其上下移动量。然后,将测定出的移动量提供给控制/算术单元。进行第7次处理,将结果记录在记录装置8上,测定表面粗糙度。

著录项

  • 公开/公告号JPH07113523B2

    专利类型

  • 公开/公告日1995-12-06

    原文格式PDF

  • 申请/专利权人 日本碍子株式会社;

    申请/专利号JP19900158773

  • 发明设计人 加藤 久佳;川崎 啓治;

    申请日1990-06-19

  • 分类号G01B5/28;G01B5/20;

  • 国家 JP

  • 入库时间 2022-08-22 03:58:15

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