apparatus and method for analysis of topografien in paper

• 1. 用于芯片实验室分析仪器的光学模块的滤波设备、用于芯片实验室分析仪器的光学模块和用于运行芯片实验室分析仪器的光学模块的方法 [P] . 中国专利： CN113167647A . 2021-07-23
• 2. 一种在纸张中施加片状防伪材料的方法、装置及防伪纸 [P] . 中国专利： CN102108652B . 2012.11.28
• 3. apparatus and method for analysis of topografien in paper [P] . SE9602938L . 1997-02-12

  机译： 纸张中topografien分析的仪器和方法

• 4. Two-dimensional bar code providing apparatus, two-dimensional bar code analysis unit, two-dimensional bar code provides a method, two-dimensional bar code analysis method, computer program, a two-dimensional bar code, and the paper [P] . 日本专利： JP5699851B2 . 2015-04-15

  机译： 二维条形码提供装置，二维条形码分析单元，二维条形码提供方法，二维条形码分析方法，计算机程序，二维条形码和纸张

• 5. APPARATUS AND METHOD FOR RAPID 3D CELL CULTURE ANALYSIS USING PAPER STACKS [P] . 世界知识产权组织专利： WO2014105581A1 . 2014-07-03

  机译： 使用纸叠进行快速3D细胞文化分析的设备和方法

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• 8. Method and apparatus for vibration detection, method and apparatus for vibration analysis, lithographic apparatus, device manufacturing method, and computer program [O] . Haico Victor Kok 2008

• 1. Geometrically Nonlinear Analysis of Structures Using Various Higher Order Solution Methods: A Comparative Analysis for Large Deformation [J] . Ali Maghami ,Farzad Shahabian ,Seyed Mahmoud Hosseini . 工程与科学中的计算机建模(英文) . 2019,第12期
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