DEVICE AND PROCESS FOR MEASURING AND ANALYSING SPECTRAL RADIATION, IN PARTICULAR FOR MEASURING AND ANALYSING COLOUR CHARACTERISTICS

摘要

A device and process are disclosed for measuring and analysing spectral radiation within a desired wavelength range. A number of N1 radiation sources are provided, as well as a sensor device which detects radiation within the desired wavelength range. The radiation sources are selected so as to be linearly independent of one another and cover the desired wavelength range with overlaps. Similarly, the sensor device has a plurality of M1 sensors whose spectral characteristics are likewise linearly independent of one another and overlap in such a way as to cover the desired wavelength range. Also provided is a control unit with a storage device in which are stored a number of calibration functions with linearly independent spectral characteristics and so linked to the output values of the sensor device that they can be used to determine the spectral changes in the radiation under investigation.