首页> 外国专利> SEMICONDUCTOR DEVICE COMPRISING A FERROELECTRIC MESEMICONDUCTOR DEVICE COMPRISING A FERROELECTRIC MEMORY ELEMENT WITH A LOWER ELECTRODE PROVIDED WITH MORY ELEMENT WITH A LOWER ELECTRODE PROVIDED WITH AN OXYGEN BARRIER AN OXYGEN BARRIER

SEMICONDUCTOR DEVICE COMPRISING A FERROELECTRIC MESEMICONDUCTOR DEVICE COMPRISING A FERROELECTRIC MEMORY ELEMENT WITH A LOWER ELECTRODE PROVIDED WITH MORY ELEMENT WITH A LOWER ELECTRODE PROVIDED WITH AN OXYGEN BARRIER AN OXYGEN BARRIER

机译:包括铁电体的半导体装置,其中铁电体的存储元件具有较低的电极,所述较低的电极由莫里元素提供,下部的电极具有氧阻挡层和氧阻挡层

摘要

The invention relates to a semiconductor device comprising a semiconductor body (3) with a semiconductor element (1) with an electrically conducting region (5) on which a capacitor (2) forming a memory element is present with a lower electrode (11), an oxidic ferroelectric dielectric (12), and an upper electrode (13), which lower electrode (11) makes electrical contact with the conducting region (5) and comprises a layer with a conductive metal oxide (112) and a layer (111) comprising platinum. The layer with the conductive metal oxide (112) acts as an oxygen barrier during manufacture. The invention also relates to a method of manufacturing such a semiconductor device. According to the invention, the device is characterized in that the layer comprising platinum (111) contains more than 15 atom % of a metal capable of forming a conductive metal oxide, and in that the layer (112) with the conductive metal oxide is present between the layer (111) comprising platinum and the ferroelectric dielectric (12). A good electrical contact between the lower electrode (11) and the conducting region (5) after manufacture is achieved thereby.
机译:本发明涉及一种半导体器件,其包括具有半导体元件(1)的半导体本体(3),该半导体元件具有导电区域(5),在该导电区域上设有构成存储元件的电容器(2)和下部电极(11),氧化物铁电介质(12)和上电极(13),下电极(11)与导电区域(5)电接触,并包括具有导电金属氧化物的层(112)和层(111)包含铂。具有导电金属氧化物的层(112)在制造期间用作氧气阻挡层。本发明还涉及一种制造这种半导体器件的方法。根据本发明,该装置的特征在于,包含铂(111)的层包含大于15原子%的能够形成导电金属氧化物的金属,并且存在具有导电金属氧化物的层(112)。在包含铂的层(111)和铁电介电层(12)之间形成介电层。由此在制造之后在下部电极(11)和导电区域(5)之间实现良好的电接触。

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