首页> 外国专利> Apparatus for measuring particle size distribution by making use of laser beam diffraction and scattering

Apparatus for measuring particle size distribution by making use of laser beam diffraction and scattering

机译:利用激光束衍射和散射测量粒度分布的装置

摘要

Laser beam L is scattered by particles in the sample cell 1. Photosensor assembly 33 detects forward scattered light and assembly 5 detects sideward and backward scattered light for the purpose of increasing the precision of measurement. Both the photosensor assemblies are temperature-monitored by sensors 6 and 7 to prevent erroneous measurement due to small temperature-dependent zero-level shifts of photosensors used in the photosensor assemblies. If temperature variations of or a temperature difference between the assemblies exceeds a predetermined value, an alarm signal is generated with the measurement interrupted automatically.
机译:激光束L被样品池1中的颗粒散射。光电传感器组件33检测前向散射光,组件5检测侧向散射光和后向散射光,以提高测量精度。这两个光电传感器组件均由传感器6和7进行温度监控,以防止由于光电传感器组件中使用的光电传感器的温度相关零电平变化小而引起的错误测量。如果组件的温度变化或组件之间的温度差超过预定值,则会生成警报信号,并自动中断测量。

著录项

  • 公开/公告号EP0434352B1

    专利类型

  • 公开/公告日1996-03-27

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号EP19900313810

  • 发明设计人 NIWA TAKESHI;

    申请日1990-12-18

  • 分类号G01N15/02;

  • 国家 EP

  • 入库时间 2022-08-22 03:48:04

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号